Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes)

Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes) by Richard A. Haight

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Author: Richard A. Haight
Published Date: 01 Jan 2012
Publisher: World Scientific Publishing Co Pte Ltd
Language: English
Format: Hardback| 680 pages
ISBN10: 9814322806
ISBN13: 9789814322805
File size: 19 Mb
File Name: Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes).pdf
Dimension: 160.02x 233.68x 43.18mm| 1,383.46g
Download Link: Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes)
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Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization. " These volumes provide the very latest in this critical technology and are an invaluable resource for scientists in both academia and industry concerned with the semiconductor future and all of science.

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